Efficient carrier-filtering performance probing of oxide buffer-layers in organic solar cell at nanoscale
Purity and surface cleanliness are paramount in the various stages of organic solar cell fabrication. In this recent work from IISER Thiruvananthapuram, Henniker’s HPT-100 bench-top plasma system plays an important role in sample preparation where subsequent Atomic Force Microscopy (AFM) methods are used to probe local property of thin film materials at the nanoscale.
Keywords
- Organic solar cell
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Photoconductive AFM
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Electrode buffer layer
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Spatiotemporal photoswitching
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Tomography