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Removal of carbon contamination prior to SEM & EDS measurement

Nano-devitrification and structural evolution of amorphous state in surface Ti-Ta-based alloy fabricated on TiNi substrate through additive thin-film electron-beam synthesis

Henniker’s HPT-100 was used in this work to remove carbon contamination on the sample’s surface before it was characterised by SEM and EDS measurements.

Recently published research from scientists at the Institute of Strength Physics and Materials Science of Siberian Branch Russian Academy of Sciences advances the understanding of Thin Film Metal Glasses (TFMGs) functional properties. TFMGs have the potential to be of great use in the microelectromechanical systems (MEMS) industry due to their small size and other useful properties. In the paper, the thermal stability and crystallisation behaviours of TFMGs with Ti-Ta film and TiNi substrate was examined. Henniker’s HPT-100 was used in this work to remove carbon contamination on the sample’s surface before it was characterised by SEM and EDS measurements.

henniker plasma sample carbon removal plasma treatment knowledge article

Henniker's HPT-100 TEM Plasma Cleaner
To read the full paper click here

Or view our dedicated Microscopy pages and our TEM plasma cleaner page for more details.


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